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Nspm-8800 Plus |
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System Introduction |
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Nspm-8800 Plus Scanning Electron Microscope is the latest breakthrough in SPM systems. The mainframe computer hardware (industrial-grade CPU) is in the all-in-one controller box which allows accurate and fast data processing. The ability to control the system wirelessly means less noise interference during scanning. At the same time, NSPM-8800 Plus has three different scanning modes and a wide range of variables that can be selected to fit personal scanning requirements. Due to this, this technology is applicable to all kinds of studies, such as nanotechnology materials, life science, electrochemistry, micro-machining and other fields of scientific research. |
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Features |
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Compact System (CPU located inside Controller Box) |
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Wireless Control (long range operational control) |
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Advanced Post Scanning (Scanning Probe Image Processor) |
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Scanning Tunneling Microscopy (STM) |
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2 Modes under Atomic Force Microscopy (Contact and Oscillating Mode) |
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Automatic Approach and Retract to avoid damaging sample and tip |
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Ability to automatically detect different scanners |
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CCD to assist in aligning laser to probe |
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Windows Vista and XP compatible programs |
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Technical Parameters |
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Resolution |
Horizontal: 0.1nm vertical: 0.01nm |
Scan Range |
20µm X 20µm |
Scanning Platform Size |
20 nm x 20nm |
Scan Frequency |
0.1Hz —100Hz |
Scan Rotation |
0 — 360° |
D/A Precision |
16bit |
A/D Precision |
16bit,16-channel |
Bias Voltage |
0 —10V |
Tunneling Current Preference |
0.1nA —10nA |
Image Resolution |
512X512,1024X1024 |
Color Quality |
True Color |
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